Index Catalog // Scholar@UC

Data of Classifying I/O Variables via Machine Learning

1 de 10

Data of SWMM I/O Associations

2 de 10

Code for SWMM's metamorphic testing

3 de 10

Data of SysML SMD Environment Assumptions

4 de 10

Data of SWMM Unit Tests

5 de 10

Corrections

6 de 10

A Process Mining Approach to Improving Defect Detection of SysML Models

7 de 10

Data of SysML Modeling Mistakes

8 de 10

Data of Software Engineering Interviews and Video Resumes

9 de 10

second round submission of Rainbow to NIST

10 de 10

Recherche