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Engineering and Applied Science
删除限定条件 学: Engineering and Applied Science
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Niu, Nan
删除限定条件 创建者: Niu, Nan
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A Process Mining Approach to Improving Defect Detection of SysML Models
1 of 9
Artifacts of `Detecting Software Vulnerabilities via Requirements Dependency Analysis'
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Data of SysML Modeling Mistakes
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Data of Software Engineering Interviews and Video Resumes
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Subject Systems Dataset
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Software delivery for PETTT BY15-080SP
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Hidden assumptions and Disagreement between stakeholders document
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Study Materials of Complementarity in Requirements Tracing
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RE'16 Viewpoint Merging Study Materials
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创建者
Niu, Nan
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Alenazi, Mounifah
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Jin, Xiaoyu
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Khatwani, Charu
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Savolainen, Juha
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defect detection
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hireability prediction
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machine learning
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model checking
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model-driven engineering
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学
Engineering and Applied Science
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- Computing Sciences & Informatics
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Elec Eng & Computing Systems
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- Elec Eng & Computing Systems
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Electrical engineering and Computer Science
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English
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出版者
University of Cincinnati
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Niu, Nan
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创建日期
2016-03-14
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2018-06
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2019-06-09
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2019-06-15
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2019-09-02
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